International Workshop on System Reliability in Cloud Computing and Big Data

SRCB 2018


Data Mining & Analysis Databases & Information Systems



The 2018 IEEE International Workshop on System Reliability in Cloud Computing and Big Data
This workshop will provide the scientific and industrial communities a dedicated forum to present new research, development, and deployment efforts in the field of System Reliability in Cloud Computing and Big Data. Recently, while significant advancements have been made to increase the system reliability of cloud computing and big data that improve the Quality of Service, such improvements are often circumscribed to the huge cloud data centers run by large cloud companies. Even stronger effort is needed to improve the reliability of these platform, as users are more tend to put their own data and business online. In this respect, advancements are needed both to monitor and improve the reliability of these systems.
The topics of interest include, but are not limited to:
* Reliability analysis of cloud data centers and cloud infrastructures
* Reliable and cost-efficient cloud architectures
* Workload characterization and optimization
* Use of virtualization to improve the reliability of cloud resources
* Dynamic workload consolidation
* Efficient balancing of applications and virtual machines
* Reliable and cost-efficient resource scheduling and optimization
* Reliability-aware data storage
* Reliability-aware resource control and monitoring
* Reliable and cost-efficient network virtualization
* Reliability of Software Defined Networks
* Efficient management of big data systems
* Condition-based maintenance of big data
* Materials state awareness and warranty prediction of big data
Important Dates:
* March 8, 2018 Submission deadline
* May 15, 2018 Author notification
* June 1, 2018 Camera-ready dues
* July 16-20, 2018 Workshop
Submission:
Authors are invited to submit original, unpublished research papers as well as industrial practice papers. Simultaneous submissions to other publications and conferences are not permitted. The length of a camera ready paper will be limited to eight pages, including the title of the paper, the name and affiliation of each author, a 150-word abstract, and up to 6 keywords. Authors must follow the IEEE Computer Society Press Proceedings Author Guidelines to prepare papers.
Program Chairs:
Liang Luo University of Electronic Science and Technology of China, China
Yanping Xiang University of Electronic Science and Technology of China, China
General Inquiries:
For more detailed and updated information, please contact Professor Liang Luo at liangluo@uestc.edu.cn or Professor Peng Sun at psun_ccse@uestc.edu.cn.